Testing, Reliability, and Application of Micro-and Nano-Materials SYstems III
Internal ID
78
Author(s)
Geer,R.E.;Meyendorf,N.;Baaklini,G.Y.;Michel,B.
Where published?
Proceedings of SPIE, vol. 5766
Year
2005
Page(s)
178 pp.
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