Papers of Micro- and Nanoreliability Symposium,

Internal ID 119
Author(s) Keller,J.; Michel, B.
Where published? Proc. NSTI Nanotechnology Conference 2011,Boston, USA,vol. 2,Electronics, Devices, Fabrication, MEMS, Chapter 3, Micro- and Nanoreliability, CRC Press, Taylors and Francis,
Year 2011
Page(s) 1-80