Comparative Characterization of Chip Epoxy Interfaces by Molecular Modeling and Contact Angle Determination

Internal ID	121
Author(s)	Hoelck,O.; Bauer,J.; Wittler,O.; Michel,B.; Wunderle,B.:
Where published?	Microelectronics Reliability 52(2012)No. 7
Year	2012
Page(s)	1285-1290