Comparative Characterization of Chip Epoxy Interfaces by Molecular Modeling and Contact Angle Determination

Internal ID 121
Author(s) Hoelck,O.; Bauer,J.; Wittler,O.; Michel,B.; Wunderle,B.:
Where published? Microelectronics Reliability 52(2012)No. 7
Year 2012
Page(s) 1285-1290