| Reliability of Micro- and Nanosystems |
Michel,B. |
Micro.tec 2003 |
Munich |
10/2003 |
| Zuverlässigkeit und Lebensdauer im Mikro-Nano-Übergangsbereich |
Michel,B. |
Packaging Tag, 10... |
Berlin |
06/2003 |
| From Microreliability to Nanoreliability-Testing Concepts and Simulati... |
Michel,B. |
1. Internat. Conf. on... |
Berlin,... |
05/2003 |
| Simulation of Crack Mechanisms in Materials |
Michel,B. |
2.Int. Conference... |
Berlin |
11/1991 |
| Reliability Research in the Micro-Nano Region at the Fraunhofer MicroM... |
Michel,B. |
Meeting of EURELNET... |
Paris,... |
01/1970 |
| MicroNanoReliability 2007 |
Michel,B.(ed.) |
1st. World Congress on... |
Berlin |
09/2007 |
| Modulare Mikrosysteme und Packaging |
Michel,B.,... |
Fachkonferenz... |
Würzburg |
05/2004 |
| Anforderungen aus der Nanotechnologie an die Zuverlässigkeitskonzepte ... |
Michel,B.,... |
1.DVM Konferenz... |
Darmstadt |
03/2006 |
| 'NanoDAC- a New Technique for Micro-and Nanomechanical Reliability Ana... |
Michel,B.,... |
Internat. Conf. on... |
Toronto,... |
05/2005 |
| MicroDAC- ein Messverfahren zur Ermittlung von Werkstoffeigenschaften ... |
Michel,B.,... |
VDI/VDE-GMA Konferenz... |
Ludwigsburg |
03/2004 |
| Local Deformation Analysis to Improve Reliability Assessment of Materi... |
Michel,B.,... |
11th. Annual SPIE... |
San Diego,... |
02/2006 |
| Nanoreliability- Fracture Mechanics on the Way from Micro to Nano |
Michel,B.,... |
Invited Plenary... |
Alexandroupo... |
06/2006 |
| MicroDAC and NanoDAC- poweful techniques for nodestructive microcrack ... |
Michel,B.,... |
Int. Conf. SPIE,... |
San Diego,... |
02/2002 |
| A new Method for Local Stress Field Analysis near Cracks in Micro- and... |
Michel,B.,... |
16. European... |
Alexandroupo... |
06/2006 |
| Materials Characterization and Reliability Estimation of Solder Joints... |
Michel,B.,... |
EU-COST Meeting... |
Lausanne,... |
02/2005 |
| Microsecurity- Sicherheit durch Miniaturisierung mit Sensorik und Mikr... |
Michel,B.,... |
BMBF Workshop zur... |
Bonn |
05/2006 |
| NanoDAC-Messverfahren zur Verformungs- und Rissanalyse im extremen Mik... |
Michel,B.,... |
Jahresmitgliederversamm... |
Dresden |
02/2005 |
| Zuverlässigkeitsbewertung von MEMS-Komponenten im Mikro.Nano-Übergangs... |
Michel,B.,... |
Tagung... |
Lichtenwalde |
11/2003 |
| 'Microsecurity'- eine europäische Initiative zum Thema Mikro- und Nano... |
Michel,B.,... |
Werkstoffwoche 2004,... |
München |
09/2004 |
| Die Kontinuitätsgleichung in der Mikro- und Makrowelt- Anwendungen in ... |
Michel,B.,... |
Symposium... |
Leipzig |
11/2003 |
| Werkstoffmechanik- Zuverlässigkeit, Test und Designmethoden im Mikro- ... |
Michel,B.,... |
Symposium 10 Jahre... |
Teltow |
09/2003 |
| Simulation and Reliability on the Way from Micro to Nano |
Michel,B.,... |
21st. CAD-FEM Users... |
Potsdam,... |
11/2003 |
| Zuverlässigkeit von komponenten der Mikrosystemtechnik durch die Einbe... |
Michel,B.,... |
Tagung Mikromechanik... |
Chemnitz |
10/2005 |
| Interface-Risse in Komponenten der Mikro- und Nanoelektronik |
Michel,B.;... |
36. Tagung des DVM... |
Aachen |
02/2006 |
| Nanoscale Deformation Measurements- Concepts for Failure and Reliabili... |
Michel,B.;... |
NSTL Nanotechnology... |
Boston |
06/2008 |
| Networking in Micro/Nano Reliability Research Encouraged by EUCEMAN,
... |
Michel,B.;... |
Microtech/Nanotech... |
Anaheim, USA |
06/2010 |
| Verformungsanalyse mit Computertomographie |
Michel,B.;... |
10.Tagung... |
Chemnitz |
10/2010 |
| Automotive Electronics and Related Nanoreliability Electronics |
Michel,B.;... |
1. Intern. Congress... |
Torino |
06/2010 |
| Micro-Nano-Systems, Applications and State of the Art |
Michel,B.;... |
5th. Int. Conf. New... |
Sibiu,... |
09/2007 |
| Microsecurity and Nanosecurity- Security Research Using the Advantages... |
Michel,B.;... |
2nd. European Conf.... |
Barcelona,... |
04/2008 |
| Microsecurity,Nanosecurity-Security Research in Europe Utilizing Advan... |
Michel,B.;... |
3rd. Leibniz... |
Lichtenwalde |
11/2007 |
| Micro-and Nanosecurity-Security by Miniaturization in Microsystem Tech... |
Michel,B.;... |
Mikrosystemtechnik... |
Dresden |
10/2007 |
| Nanoreliability- Zuverlässigkeitskonzepte für den Mikro-Nano-Übergangs... |
Michel,B.;... |
3rd Leibniz Conference... |
Lichtenwalde |
11/2007 |
| Rissvermeidungsstrategien in Werkstoffen mit Kunststoffen |
Michel,B.;Faust... |
13. Problemseminar... |
Merseburg |
06/2011 |
| Reliability of Electronics in Aviation |
Michel,B.;Kaulf... |
3rd. Dresden Airport... |
Dresden |
12/2007 |
| From Microelectronics to Nanoelectronics- Reliability and Packaging Is... |
Michel,B.;Reich... |
SEMI, Nanoelectronics... |
Munich |
04/2006 |
| Rissvermeidungsstrategien für Mikrosysteme aus Werkstoffverbunden mit ... |
Michel,B.;Winkl... |
11. Chemnitzer... |
Chemnitz |
10/2012 |
| Security Assistance Systems- Security Support by Integration of Sensor... |
Michel,B.;Winkl... |
Safety and Security... |
Potsdam |
11/2006 |
| Microreliability, Nanoreliability-Reliability Issues for MEMS |
Michel.B. |
1st. Int. Forum on... |
Potsdam |
12/2003 |
| Zuverlässigkeitsprobleme im Hightech-Bereich- Lösungsansätze und Konze... |
Michel; B. |
Leibniz Societät,... |
Berlin |
12/2006 |
| Röntgen-Computertomographie(CT)- Werkzeug für die
Zustands- und Schad... |
Noack, E.;... |
Int. Conf. Micro Car... |
Leipzig |
02/2013 |
| Influence of rate-dependent material data on the reliability of advanc... |
Poshtan, E.;... |
MSE Materials Science... |
Darmstadt |
09/2012 |
| Accelerated Failure Test for High- T Applications of Power Mosfet by P... |
Schacht,R.,... |
International Workshop... |
Belgirate,... |
09/2005 |
| Reliability Characterization by Stress Chip Measurements |
Schindler-Saefk... |
MSE-Materials Science... |
Darmstadt |
09/2012 |
| Stress Chip Measurements of Internal Package Stresses for Process Char... |
Schindler-Saefk... |
EuroSimE 2012,... |
Lissabon,... |
04/2012 |
| Application of Fracture Mechanics for the Reliability Analysis of Asse... |
Shirangi, H.,... |
Conference Micro Car... |
Leipzig |
02/2013 |
| Numerical Characterization of Electronic Packaging Solutions based on ... |
Sommer,J.-P.,... |
6th. Internat. Conf.... |
Shenzen,... |
08/2005 |
| FibDAC Stress Relief - a Novel Stress Measurement Approach for Semicon... |
Vogel, D;... |
Microtech/Nanotech... |
Anaheim, USA |
10/2010 |
| Characterization approaches of nanoscale modified plastics |
Vogel,D.,... |
4th IEEE Conference on... |
Munich |
08/2004 |
| A new Approach to Measure Local Residual Stresses |
Vogel,D.,... |
N/A |
Dresden |
01/1970 |
