Reliability Characterization by Stress Chip Measurements

Internal ID	202
Author(s)	Schindler-Saefkow, F.; Rost, F.; Otto, A.; Winkler, T.; Rzepka, S.; Michel, B.
Event	MSE-Materials Science and Engineering Congress, Symposium D3 Reliability
Location	Darmstadt
Date	25.09.2012
End date	27.09.2012