Nanoreliability for Mechanically Loaded Devices

Internal ID	99
Author(s)	Vogel,D., Sabate,N., Wunderle,B., Keller,J., Michel,B., Reichl,H
Event	International Congress of Nanotechnology 2005 (ICN2005)
Location	San Francisco, USA
Date	01.11.2005
End date	04.11.2005