Networking in Micro/Nano Reliability Research Encouraged by EUCEMAN, the European Center for Micro- and Nanoreliability

Internal ID	182
Author(s)	Michel,B.; Hammacher, J.; Winkler, T.: Kaulfersch, E.
Event	Microtech/Nanotech Conference 2010, Workshop Micro- and Nanoreliability
Location	Anaheim, USA
Date	21.06.2010
End date	23.12.1994