Networking in Micro/Nano Reliability Research Encouraged by EUCEMAN, the European Center for Micro- and Nanoreliability

Internal ID 182
Author(s) Michel,B.; Hammacher, J.; Winkler, T.: Kaulfersch, E.
Event Microtech/Nanotech Conference 2010, Workshop Micro- and Nanoreliability
Location Anaheim, USA
Date 21.06.2010
End date 23.12.1994