Reliability Characterization by Stress Chip Measurements
Internal ID
202
Author(s)
Schindler-Saefkow, F.; Rost, F.; Otto, A.; Winkler, T.; Rzepka, S.; Michel, B.
Event
MSE-Materials Science and Engineering Congress, Symposium D3 Reliability
Location
Darmstadt
Date
25.09.2012
End date
27.09.2012