Nanoreliability for Mechanically Loaded Devices

Internal ID 99
Author(s) Vogel,D., Sabate,N., Wunderle,B., Keller,J., Michel,B., Reichl,H
Event International Congress of Nanotechnology 2005 (ICN2005)
Location San Francisco, USA
Date 01.11.2005
End date 04.11.2005