Computational Assessment of Interconnection Technology for High Power, High Frequency SiC and GaN Transistors

Interne ID 63
Autor(en) Kaulfersch,E., Michel,B.
Wo veröffentlicht? Proc. Internat. Conf. on High Temperature Electronics, Oxford 2003 (ed. D. Johnston)
Jahr 2003
Seite(n) 79-86