Computational Assessment of Interconnection Technology for High Power, High Frequency SiC and GaN Transistors
Interne ID
63
Autor(en)
Kaulfersch,E., Michel,B.
Wo veröffentlicht?
Proc. Internat. Conf. on High Temperature Electronics, Oxford 2003 (ed. D. Johnston)
Jahr
2003
Seite(n)
79-86