Computational Assessment of Interconnection Technology for High Power, High Frequency SiC and GaN Transistors

Interne ID	63
Autor(en)	Kaulfersch,E., Michel,B.
Wo veröffentlicht?	Proc. Internat. Conf. on High Temperature Electronics, Oxford 2003 (ed. D. Johnston)
Jahr	2003
Seite(n)	79-86