Nanoscale Deformation Measurements- Concepts for Failure and Reliability Assessment at the Nanoscale

Interne ID	165
Autor(en)	Michel,B.; Gollhardt, A.; Keller, J.
Veranstaltung	NSTL Nanotechnology Conference, Workshop Nanoreliability
Ort	Boston
Datum	01.06.2008
Enddatum	05.06.2008