Reliability Testing of Polytronics Components in the Micro-Nano Region

Interne ID	110
Autor(en)	Michel, B., Dudek,R., Walter,H.
Veranstaltung	Invited Plenara Lecture, Int. Conference Polytronics 2005
Ort	Wroclaw, Poland
Datum	23.10.2005
Enddatum	26.10.2005