Simulation and Reliability on the Way from Micro to Nano

Interne ID	63
Autor(en)	Michel,B., Wunderle,B.
Veranstaltung	21st. CAD-FEM Users Meeting 2003, invited plenary lecture, Int. Congress on FEM Technology
Ort	Potsdam, Germany
Datum	12.11.2003
Enddatum	14.11.2003