A new Method for Local Stress Field Analysis near Cracks in Micro- and Nanotechnology Applications

Interne ID	105
Autor(en)	Michel,B., Vogel,D., Sabate,N., Lieske,D.
Veranstaltung	16. European Conference on Fracture (ECF16)
Ort	Alexandroupolis, Greece
Datum	03.06.2006
Enddatum	07.06.2006