NanoDAC - a new experimental method for reliability analysis in advanced packaging

Interne ID	4
Autor(en)	Michel, B.; Vogel, D.; Auersperg, J.; Döring, R.
Veranstaltung	4th Int. Workshop Area Array Packaging
Ort	Berlin, Germany
Datum	22.04.2002
Enddatum	23.04.2002